http://en.wikipedia.org/wiki/Wafer_testing#Wafer_prober
http://efreedom.com/Question/E-5621/Fast...uire-Power
and because of that... increasing voltage maintains stablitiy if the production serie is not perfect
or maybe intel got a problem with
http://en.wikipedia.org/wiki/Leakage_(electronics)
iam not your wikipedia...
Quote:In some very specific cases, a die that passes some but not all test patterns can still be used as a product, typically with limited functionality.
The most common example of this is a microprocessor for which only one part of the on-die cache memory is functional.
In this case, the processor can sometimes still be sold as a lower cost part with a smaller amount of memory and thus lower performance.
Additionally when bad dies have been identified, the die from the bad bin can be used by production personnel for assembly line setup.
http://efreedom.com/Question/E-5621/Fast...uire-Power
and because of that... increasing voltage maintains stablitiy if the production serie is not perfect
or maybe intel got a problem with
http://en.wikipedia.org/wiki/Leakage_(electronics)
Quote:higher voltage results in higher leakage current.
In high transistor count devices like a modern desktop CPU leakage current can account for the majority of power dissipation.
As process size gets smaller and transistor counts rise, leakage current becomes more and more the critical power usage statistic.
iam not your wikipedia...
EDIT by neobrain: that pic was kinda annoying..
EDIT by dannzen: don't fuck with my sig
EDIT by neobrain: yet, I will keep doing it
EDIT by ???? : A WILD DACO APPEARS
EDIT by [SS]: Hey guys, what's going on here?
EDIT by dannzen: Gotta Catch 'em All!
EDIT by ???? : WILD DACO BROKE FREE FROM MASTER BALL
EDIT by dannzen: don't fuck with my sig
EDIT by neobrain: yet, I will keep doing it
EDIT by ???? : A WILD DACO APPEARS
EDIT by [SS]: Hey guys, what's going on here?
EDIT by dannzen: Gotta Catch 'em All!
EDIT by ???? : WILD DACO BROKE FREE FROM MASTER BALL